Record Type
Journal Articles

Contributor Information

Author(s)
Zhou Y, Ambarish C, Gruenke R, Jaeckel F, Kripps K, McCammon D, Morgan K, Wulf D, Zhang S, Adams J, Bandler S,
Chervenak J, Datesman A, Eckart M, Ewin A, Finkbeiner F, Kelley R, Kilbourne C, Miniussi A, Porter F, Sadleir J, Sakai K, Smith S, Wakeham N, Wassell E, Yoon W
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Title Information

Full Title
Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV Curve and Complex Admittance Measurements

Identifiers

DOI
10.1007/s10909-018-1970-8
ISSN
1573-7357

Publication Information

Publication Date
2018
Citation
Zhou Y, Ambarish C, Gruenke R, Jaeckel F, Kripps K, McCammon D, Morgan K, Wulf D, Zhang S, Adams J, et al. Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV Curve and Complex Admittance Measurements. Journal of Low Temperature Physics. 2018;

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