Record Type
Journal Articles

Contributor Information

Author(s)
Chiao M, Smith S, Kilbourne C, Adams J, Bandler S, Betancourt-Martinez G, Chervenak J, Datesman A, Eckart M, Ewin A, Finkbeiner F,
Figueroa-Feliciano E, Kelley R, Lee S, Leutenegger M, Porter F, Sadleir J, Wassell E, Yoon W
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Title Information

Full Title
Parametric Characterization of TES Detectors under DC Bias

Identifiers

DOI
10.1109/TASC.2016.2645164

Publication Information

Publication Date
2016
Volume
PP
Issue
99
First Page
1
Last Page
1
Citation
Chiao M, Smith S, Kilbourne C, Adams J, Bandler S, Betancourt-Martinez G, Chervenak J, Datesman A, Eckart M, Ewin A, et al. Parametric Characterization of TES Detectors under DC Bias. IEEE Transactions on Applied Superconductivity. 2016;PP (99):1-1.

Copyright