Record Type
Proceedings

Contributor Information

Author(s)
Coulter P, Ohl R, Blake P, Bos B, Chambers V, Eichhorn W, Gum J, Hadjimichael T, Hagopian J, Hayden J, Hetherington S,
Kubalak D, Mclean K, McMann J, Redman K, Sampler H, Wenzel G, Young J
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Title Information

Full Title
A Toolbox of Metrology-based Techniques for Optical System Alignment
Publication Title (abbreviated)
PROC SPIE

Identifiers

DOI
10.1117/12.2239070
ISSN
0277-786X
ISBN
978-1-5106-0293-9; 978-1-5106-0294-6
Article Number
UNSP 995108

Publication Information

Publication Date
2016
Volume
9951
Page Count
20

Conference Information

Conference Date
AUG 28-29, 2016
Conference Location
Conference Sponsor
Citation
Coulter P, Ohl R, Blake P, Bos B, Chambers V, Eichhorn W, Gum J, Hadjimichael T, Hagopian J, Hayden J, et al. A Toolbox of Metrology-based Techniques for Optical System Alignment. In: Optical System Alignment, Tolerancing, and Verification X. 10th Conference on Optical System Alignment, Tolerancing, and Verification X; 2016. p. 20.

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