Record Type
Journal Articles

Contributor Information

Author(s)
Wang J, Wong W, Wolday S, Cronquist B, McCollum J, Katz R, Kleyner I

Title Information

Full Title
Single event upset and hardening in 0.15 mu m antifuse-based field programmable gate array
Publication Title (abbreviated)
IEEE T NUCL SCI

Identifiers

DOI
10.1109/TNS.2003.822090
ISSN
0018-9499

Publication Information

Publication Date
2003 Dec
Volume
50
Issue
6
First Page
2158
Last Page
2166
Page Count
9
Citation
Wang J, Wong W, Wolday S, Cronquist B, McCollum J, Katz R, Kleyner I. Single event upset and hardening in 0.15 mu m antifuse-based field programmable gate array. IEEE T NUCL SCI. 2003;50 (6):2158-2166.

Copyright