Record Type
Journal Articles

Contributor Information

Author(s)
McMorrow D, Buchner S, Baze M, Bartholet B, Katz R, O'Bryan M, Poivey C, LaBel K, Ladbury R, Maher M, Sexton F

Title Information

Full Title
Laser-Induced latchup screening and mitigation in CMOS devices
Publication Title (abbreviated)
IEEE T NUCL SCI

Identifiers

DOI
10.1109/TNS.2006.880929
ISSN
0018-9499

Publication Information

Publication Date
2006 Aug
Volume
53
Issue
4
First Page
1819
Last Page
1824
Page Count
6
Citation
McMorrow D, Buchner S, Baze M, Bartholet B, Katz R, O'Bryan M, Poivey C, LaBel K, Ladbury R, Maher M, et al. Laser-Induced latchup screening and mitigation in CMOS devices. IEEE T NUCL SCI. 2006;53 (4):1819-1824.

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