Record Type
Journal Articles

Contributor Information

Author(s)
Marshall C, Marshall P, Ladbury R, Waczynski A, Arora R, Foltz R, Cressler J, Kahle D, Chen D, Delo G, Dodds N,
Pellish J, Kan E, Boehm N, Reed R, LaBel K
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Title Information

Full Title
Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16-300 K
Publication Title (abbreviated)
IEEE TRANS NUCL SCI

Identifiers

DOI
10.1109/TNS.2010.2085018
ISSN
0018-9499

Publication Information

Publication Date
2010 Dec
Volume
57
Issue
6
First Page
3078
Last Page
3086
Page Count
9
Citation
Marshall C, Marshall P, Ladbury R, Waczynski A, Arora R, Foltz R, Cressler J, Kahle D, Chen D, Delo G, et al. Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16-300 K. IEEE TRANS NUCL SCI. 2010;57 (6):3078-3086.

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