Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16-300 K

Record Type

  • Journal Articles

Full Title

  • Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16-300 K

Author(s)

  • Marshall C, Marshall P, Ladbury R, Waczynski A, Arora R, Foltz R, Cressler J, Kahle D, Chen D, Delo G, Dodds N, Pellish J, Kan E, Boehm N, Reed R, LaBel K

Publication Title

Publication Title (abbreviated)

  • IEEE TRANS NUCL SCI

Publication Date

  • 2010 Dec

DOI

  • 10.1109/TNS.2010.2085018

ISSN

  • 0018-9499

Volume

  • 57

Issue

  • 6

Page Count

  • 9

First Page

  • 3078

Last Page

  • 3086

Keyword(s)

Citation

  • Marshall C, Marshall P, Ladbury R, Waczynski A, Arora R, Foltz R, Cressler J, Kahle D, Chen D, Delo G, et al. Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16-300 K. IEEE TRANS NUCL SCI. 2010;57 (6):3078-3086.

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