Construction, test and calibration of the GLAST silicon tracker

Record Type
Proceedings
Full Title
Construction, test and calibration of the GLAST silicon tracker
Author(s)
Sgro C, Atwood W, Baldini L, Barbiellini G, Bellazzini R, Belli F, Bonamente E, Borden T, Bregeon J, Brez A, Brigida M, Caliandro G, Cecchi C, Cohen-Tanugi J, De Angelis A, Drell P, Favuzzi C, Fukazawa Y, Fusco P, Gargano F, Germani S, Giglietto N, Giordano F, Himel T, Hirayama M, Johnson R, Katagiri H, Kataoka J, Kawai N, Kroeger W, Kuss M, Latronico L, Longo F, Loparco F, Lubrano P, Massai M, Mazziotta M, Minuti M, Mizuno T, Morselli A, Nelson D, Nordby M, Ohsugi T, Omodei N, Ozaki M, Pepe M, Raino S, Rando R, Razzano M, Rich D, Sadrozinski H, Scolieri G, Spandre G, Spinelli P, Sugizaki M, Tajima H, Takahashi H, Takahashi T, Yoshida S, Young C, Ziegler M
Publication Title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Publication Title (abbreviated)
NUCL INSTRUM METH PHYS RES A
Publication Date
2007 Dec 11
DOI
10.1016/j.nima.2007.08.224
ISSN
0168-9002
Volume
583
Issue
1 Sp. Iss. SI
Page Count
5
First Page
9
Last Page
13
Conference Name
6th International Conference on Radiation Effects on Semiconductor Materials, Detectors, and Devices
Conference Date
OCT 10-13, 2006
Conference Location
Florence, ITALY
Conference Sponsor
Univ Florence, Inst Nazionale Fisica Scienza
Keyword(s)
Instruments & Instrumentation, Nuclear Science & Technology, Physics, Particles & Fields, Spectroscopy, gamma-ray, silicon, tracker, calibration, beam test, AREA SPACE TELESCOPE, READOUT ELECTRONICS
Citation
Sgro C, Atwood W, Baldini L, Barbiellini G, Bellazzini R, Belli F, Bonamente E, Borden T, Bregeon J, Brez A, et al. Construction, test and calibration of the GLAST silicon tracker. In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. 6th International Conference on Radiation Effects on Semiconductor Materials, Detectors, and Devices; 2007. p. 9-13.
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