Effect of nitrogen gas on the lifetime at carbon nanotube field emitters for electron-impact ionization mass spectrometry

Record Type
Proceedings
Full Title
Effect of nitrogen gas on the lifetime at carbon nanotube field emitters for electron-impact ionization mass spectrometry
Author(s)
Getty S, Bis R, Snyder S, Gehrels E, Ramirez K, King T, Roman P, Mahaffy P
Publication Title
MICRO (MEMS) AND NANOTECHNOLOGIES FOR SPACE, DEFENSE, AND SECURITY II
Publication Title (abbreviated)
P SOC PHOTO-OPT INSTRUM ENG
Publication Date
2008
DOI
10.1117/12.776914
ISSN
0277-786X
ISBN
978-0-8194-7150-5
Volume
6959
Page Count
10
First Page
95907
Last Page
95907
Article Number
695907
Conference Name
2nd Conference on Micro (MEMS) and Nanotechnologies for Space, Defense, and Security
Conference Date
MAR 18-20, 2008
Conference Location
Orlando, FL
Conference Sponsor
SPIE
Keyword(s)
Nanoscience & Nanotechnology, Optics, carbon nanotube, field emission, lifetesting, electron-impact ionization, EMISSION PROPERTIES, ARRAYS, MICROSCOPY
Citation
Getty S, Bis R, Snyder S, Gehrels E, Ramirez K, King T, Roman P, Mahaffy P. Effect of nitrogen gas on the lifetime at carbon nanotube field emitters for electron-impact ionization mass spectrometry. In: MICRO (MEMS) AND NANOTECHNOLOGIES FOR SPACE, DEFENSE, AND SECURITY II. 2nd Conference on Micro (MEMS) and Nanotechnologies for Space, Defense, and Security; 2008. p. 95907-95907.
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