Chen, Dakai

rss
  1. Chen D, Kim H, Phan A, Wilcox E, LaBel K, Buchner S, Khachatrian A, Roche N. SINGLE-EVENT EFFECT PERFORMANCE OF A COMMERCIAL EMBEDDED RERAM. Nuclear Science, IEEE Transactions on. 2014;PP (99):1-7.
    Publication Details
  2. Le Vine D, de Matthaeis P, Ruf C, Chen D, Dinnat E. AQUARIUS RFI DETECTION AND MITIGATION. In: Geoscience and Remote Sensing Symposium (IGARSS), 2013 IEEE International. Geoscience and Remote Sensing Symposium (IGARSS), 2013 IEEE International; JULY 2013; 2013. p. 1798-1800.
    Publication Details
  3. Boutte A, Cochran D, Chen D, Campola M, Pellish J, Ladbury R, Wilcox E, Lauenstein J, Gigliuto R, LaBel K, O'Bryan M. COMPENDIUM OF RECENT TOTAL IONIZING DOSE AND DISPLACEMENT DAMAGE FOR CANDIDATE SPACECRAFT ELECTRONICS FOR NASA. In: Radiation Effects Data Workshop (REDW), 2013 IEEE. Radiation Effects Data Workshop (REDW), 2013 IEEE; 2013; 2013. p. 1-9.
    Publication Details
  4. Oldham T, Chen D, Friendlich M, LaBel K. RETENTION CHARACTERISTICS OF COMMERCIAL NAND FLASH MEMORY AFTER RADIATION EXPOSURE. IEEE Trans. Nucl. Sci. 2012;59 (6):3011-3015.
    Publication Details
  5. Allen G, Adell P, Chen D, Musil P. SINGLE-EVENT TRANSIENT TESTING OF LOW DROPOUT PNP SERIES LINEAR VOLTAGE REGULATORS. IEEE Trans. Nucl. Sci. 2012;59 (6):2764-2771.
    Publication Details
  6. Oldham T, Chen D, Friendlich M, Carts M, Seidleck C, LaBel K. EFFECT OF RADIATION EXPOSURE ON THE RETENTION OF COMMERCIAL NAND FLASH MEMORY. IEEE Trans. Nucl. Sci. 2011;58 (6):2904-2910.
    Publication Details
  7. Chen D, Pease R, Kruckmeyer K, Forney J, Phan A, Carts M, Cox S, Burns S, Albarian R, Holcombe B, Little B, Salzman J, Chaumont G, Duperray H, Ouellet A, Buchner S, LaBel K. ENHANCED LOW DOSE RATE SENSITIVITY AT ULTRA-LOW DOSE RATES. Nuclear Science, IEEE Transactions on. 2011;PP (99):
    Publication Details
  8. Marshall C, Marshall P, Ladbury R, Waczynski A, Arora R, Foltz R, Cressler J, Kahle D, Chen D, Delo G, Dodds N, Pellish J, Kan E, Boehm N, Reed R, LaBel K. MECHANISMS AND TEMPERATURE DEPENDENCE OF SINGLE EVENT LATCHUP OBSERVED IN A CMOS READOUT INTEGRATED CIRCUIT FROM 16-300 K. IEEE Trans. Nucl. Sci. 2010;57 (6):3078-3086.
    Publication Details
  9. Chen D, Buchner S, Phan A, Kim H, Sternberg A, McMorrow D, LaBel K. EFFECTS OF ELEVATED TEMPERATURE ON PULSED-LASER-INDUCED SINGLE EVENT TRANSIENTS IN ANALOG DEVICES. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 46th Annual IEEE International Nuclear and Space Radiation Effects Conference; JUL 20-24, 2009; Quebec City, CANADA. 2009. p. 3138-3144.
    Publication Details
  10. O'Bryan M, LaBel K, Pellish J, Buchner S, Ladbury R, Oldham T, Kim H, Campola M, Lauenstein J, Chen D, Berg M, Sanders A, Marshall P, Marshall C, Xapsos M, Kruckmeyer K, Leftwich M, Leftwich M, Benedetto J. SINGLE EVENT EFFECTS COMPENDIUM OF CANDIDATE SPACECRAFT ELECTRONICS FOR NASA. In: 2009 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD. IEEE Radiation Effects Data Workshop; JUL 20-24, 2009; Quebec, CANADA. 2009. p. 15-24.
    Publication Details
  11. Cochran D, Buchner S, Chen D, Kim H, LaBel K, Oldham T, Campola M, O'Bryan M, Ladbury R, Marshall C, Sanders A, Xapsos M. TOTAL IONIZING DOSE AND DISPLACEMENT DAMAGE COMPENDIUM OF CANDIDATE SPACECRAFT ELECTRONICS FOR NASA. In: 2009 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD. IEEE Radiation Effects Data Workshop; JUL 20-24, 2009; Quebec, CANADA. 2009. p. 25-31.
    Publication Details
  12. Campola M, Chen D, LaBel K. TWO POST-IRRADIATION TEMPERATURE TECHNIQUES FOR TOTAL IONIZING DOSE. In: 2009 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD. IEEE Radiation Effects Data Workshop; JUL 20-24, 2009; Quebec, CANADA. 2009. p. 152-156.
    Publication Details
  13. Bellini M, Jun B, Chen T, Cressler J, Marshall P, Chen D, Schrimpf R, Fleetwood D, Cai J. X-RAY IRRADIATION AND BIAS EFFECTS IN FULLY-DEPLETED AND PARTIALLY-DEPLETED SIGEHBTS FABRICATED ON CMOS-COMPATIBLE SOI. IEEE Trans. Nucl. Sci. 2006;53 (6):3182-3186.
    Publication Details
Viewing All
Displaying publications 1 to 13 (13 total)