Pellish, Jonathan Allen

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  1. Berg M, Friendlich M, Kim H, Seidlick C, LaBel K, Ladbury R, Pellish J. CHARACTERIZING THE EFFECTS OF SINGLE EVENT UPSETS ON SYNCHRONOUS DATA PATHS. Nuclear Science, IEEE Transactions on. 2013;PP (99):
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  2. Boutte A, Cochran D, Chen D, Campola M, Pellish J, Ladbury R, Wilcox E, Lauenstein J, Gigliuto R, LaBel K, O'Bryan M. COMPENDIUM OF RECENT TOTAL IONIZING DOSE AND DISPLACEMENT DAMAGE FOR CANDIDATE SPACECRAFT ELECTRONICS FOR NASA. In: Radiation Effects Data Workshop (REDW), 2013 IEEE. Radiation Effects Data Workshop (REDW), 2013 IEEE; 2013; 2013. p. 1-9.
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  3. King M, Reed R, Weller R, Mendenhall M, Schrimpf R, Sierawski B, Sternberg A, Narasimham B, Wang J, Pitta E, Bartz B, Reed D, Monzel C, Baumann R, Deng X, Pellish J, Berg M, Seidleck C, Auden E, Weeden-Wright S, Gaspard N, Zhang C, Fleetwood D. ELECTRON-INDUCED SINGLE-EVENT UPSETS IN STATIC RANDOM ACCESS MEMORY. IEEE Trans. Nucl. Sci. 2013;60 (6):4122-4129.
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  4. Pellish J, Galloway K. IEEE NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE: NOTES ON THE EARLY CONFERENCES. Nuclear Science, IEEE Transactions on. 2013;60 (3):1681-1689.
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  5. Dodds N, Hooten N, Reed R, Schrimpf R, Warner J, Roche N, McMorrow D, Buchner S, Jordan S, Pellish J, Bennett W, Gaspard N, King M. SEL-SENSITIVE AREA MAPPING AND THE EFFECTS OF REFLECTION AND DIFFRACTION FROM METAL LINES ON LASER SEE TESTING. IEEE Trans. Nucl. Sci. 2013;60 (4):2550-2558.
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  6. Berg M, Kim H, Phan A, Seidleck C, LaBel K, Pellish J. SINGLE EVENT INDUCED MULTIPLE BIT ERRORS AND THE EFFECTS OF LOGIC MASKING. IEEE Trans. Nucl. Sci. 2013;60 (6):4192-4199.
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  7. Dodds N, Hooten N, Reed R, Schrimpf R, Warner J, Roche N, McMorrow D, Wen S, Wong R, Salzman J, Jordan S, Pellish J, Marshall C, Gaspard N, Bennett W, Zhang E, Bhuva B. EFFECTIVENESS OF SEL HARDENING STRATEGIES AND THE LATCHUP DOMINO EFFECT. IEEE Trans. Nucl. Sci. 2012;59 (6):2642-2650.
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  8. Schwank J, Shaneyfelt M, Ferlet-Cavrois V, Dodd P, Blackmore E, Pellish J, Rodbell K, Heidel D, Marshall P, LaBel K, Gouker P, Tam N, Wong R, Wen S, Reed R, Dalton S, Swanson S. HARDNESS ASSURANCE TESTING FOR PROTON DIRECT IONIZATION EFFECTS. IEEE Trans. Nucl. Sci. 2012;59 (4):1197-1202.
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  9. Rodbell K, Heidel D, Pellish J, Marshall P, Tang H, Murray C, LaBel K, Gordon M, Stawiasz K, Schwank J, Berg M, Kim H, Friendlich M, Phan A, Seidleck C. 32 AND 45 NM RADIATION-HARDENED-BY-DESIGN (RHBD) SOI LATCHES. IEEE Trans. Nucl. Sci. 2011;58 (6):2702-2710.
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  10. Schwank J, Shaneyfelt M, Dodd P, McMorrow D, Warner J, Ferlet-Cavrois V, Gouker P, Melinger J, Pellish J, Rodbell K, Heidel D, Marshall P, LaBel K, Swanson S. COMPARISON OF SINGLE AND TWO-PHOTON ABSORPTION FOR LASER CHARACTERIZATION OF SINGLE-EVENT UPSETS IN SOI SRAMS. IEEE Trans. Nucl. Sci. 2011;58 (6):2968-2975.
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  11. O\'Bryan M, LaBel K, Pellish J, Lauenstein J, Chen D, Marshall C, Oldham T, Kim H, Phan A, Berg M, Campola M, Sanders A, Marshall P, Xapsos M, Heidel D, Rodbell K, Swonger J, Alexander D, Gauthier M, Gauthier B. RECENT SINGLE EVENT EFFECTS COMPENDIUM OF CANDIDATE ELECTRONICS FOR NASA SPACE SYSTEMS. In: Radiation Effects Data Workshop (REDW), 2011 IEEE. Radiation Effects Data Workshop (REDW), 2011 IEEE; JULY 2011; 2011. p. 1-13.
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  12. Seifert N, Gill B, Pellish J, Marshall P, LaBel K. SUSCEPTIBILITY OF 45 AND 32 NM BULK CMOS LATCHES TO LOW-ENERGY PROTONS. IEEE Trans. Nucl. Sci. 2011;58 (6):2711-2718.
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  13. Schwank J, Shaneyfelt M, McMorrow D, Ferlet-Cavrois V, Dodd P, Heidel D, Marshall P, Pellish J, LaBel K, Rodbell K, Hakey M, Flores R, Swanson S, Dalton S. ESTIMATION OF HEAVY-ION LET THRESHOLDS IN ADVANCED SOI IC TECHNOLOGIES FROM TWO-PHOTON ABSORPTION LASER MEASUREMENTS. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 10th European Conference on Radiation and Its Effects on Components and Systems (RADECS - 09); SEP 14-18, 2009; Bruges, BELGIUM. 2010. p. 1827-1834.
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  14. Pellish J, Xapsos M, LaBel K, Marshall P, Heidel D, Rodbell K, Hakey M, Dodd P, Shaneyfelt M, Schwank J, Baumann R, Deng X, Marshall A, Sierawski B, Black J, Reed R, Schrimpf R, Kim H, Berg M, Campola M, Friendlich M, Perez C, Phan A, Seidleck C. HEAVY ION TESTING WITH IRON AT 1 GEV/AMU. IEEE Transactions on Nuclear Science. 2010;57 (5):2948-2954.
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  15. Pellish J, Xapsos M, Stauffer C, Jordan T, Sanders A, Ladbury R, Oldham T, Marshall P, Heidel D, Rodbell K. IMPACT OF SPACECRAFT SHIELDING ON DIRECT IONIZATION SOFT ERROR RATES FOR SUB-130 NM TECHNOLOGIES. IEEE Trans. Nucl. Sci. 2010;57 (6):3183-3189.
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  16. Marshall C, Marshall P, Ladbury R, Waczynski A, Arora R, Foltz R, Cressler J, Kahle D, Chen D, Delo G, Dodds N, Pellish J, Kan E, Boehm N, Reed R, LaBel K. MECHANISMS AND TEMPERATURE DEPENDENCE OF SINGLE EVENT LATCHUP OBSERVED IN A CMOS READOUT INTEGRATED CIRCUIT FROM 16-300 K. IEEE Trans. Nucl. Sci. 2010;57 (6):3078-3086.
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  17. Sierawski B, Mendenhall M, Reed R, Clemens M, Weller R, Schrimpf R, Blackmore E, Trinczek M, Hitti B, Pellish J, Baumann R, Wen S, Wong R, Tam N. MUON-INDUCED SINGLE EVENT UPSETS IN DEEP-SUBMICRON TECHNOLOGY. IEEE Trans. Nucl. Sci. 2010;57 (6):3273-3278.
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  18. Wilcox E, Phillips S, Cressler J, Marshall P, Carts M, Pellish J, Richmond L, Mathes W, Randall B, Post D, Gilbert B, Daniel E. NON-TMR SEU-HARDENING TECHNIQUES FOR SIGE HBT SHIFT REGISTERS AND CLOCK BUFFERS. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 10th European Conference on Radiation and Its Effects on Components and Systems (RADECS - 09); SEP 14-18, 2009; Bruges, BELGIUM. 2010. p. 2119-2123.
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  19. Pellish J, LaBel K. PRACTICALITY OF EVALUATING SOFT ERRORS IN COMMERCIAL SUB-90 NM CMOS FOR SPACE APPLICATIONS. Reliability Physics Symposium (IRPS), 2010 IEEE International; 2010. p. 768-774.
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  20. Turowski M, Pellish J, Moen K, Raman A, Cressler J, Reed R, Niu G. RECONCILING 3-D MIXED-MODE SIMULATIONS AND MEASURED SINGLE-EVENT TRANSIENTS IN SIGE HBTS. IEEE Trans. Nucl. Sci. 2010;57 (6):3342-3348.
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