Ladbury, Raymond L.

  1. Chen D, Wilcox E, Ladbury R, Kim H, Phan A, Seidleck C, LaBel K. HEAVY ION IRRADIATION FLUENCE DEPENDENCE FOR SINGLE-EVENT UPSETS IN A NAND FLASH MEMORY. IEEE Transactions on Nuclear Science. 2016;PP (99):1-1.
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  2. Xapsos M, Stauffer C, Phan A, McClure S, Ladbury R, Pellish J, Campola M, LaBel K. INCLUSION OF RADIATION ENVIRONMENT VARIABILITY IN TOTAL DOSE HARDNESS ASSURANCE METHODOLOGY. IEEE Transactions on Nuclear Science. 2016;PP (99):1-7.
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  3. Casey M, Lauenstein J, Ladbury R, Wilcox E, Topper A, LaBel K. SCHOTTKY DIODE DERATING FOR SURVIVABILITY IN A HEAVY ION ENVIRONMENT. IEEE Trans. Nucl. Sci. 2015;62 (6):2482-2489.
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  4. Ladbury R, Campola M. STATISTICAL MODELING FOR RADIATION HARDNESS ASSURANCE: TOWARD BIGGER DATA. Nuclear Science, IEEE Transactions on. 2015;PP (99):1-14.
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  5. Ladbury R, Lauenstein J, Hayes K. USE OF PROTON SEE DATA AS A PROXY FOR BOUNDING HEAVY-ION SEE SUSCEPTIBILITY. Nuclear Science, IEEE Transactions on. 2015;62 (6):2505-2510.
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  6. Ladbury R, Campola M. BAYESIAN METHODS FOR BOUNDING SINGLE-EVENT RELATED RISK IN LOW-COST SATELLITE MISSIONS. Nuclear Science, IEEE Transactions on. 2013;PP (99):
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  7. Berg M, Friendlich M, Kim H, Seidlick C, LaBel K, Ladbury R, Pellish J. CHARACTERIZING THE EFFECTS OF SINGLE EVENT UPSETS ON SYNCHRONOUS DATA PATHS. Nuclear Science, IEEE Transactions on. 2013;PP (99):
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  8. Boutte A, Cochran D, Chen D, Campola M, Pellish J, Ladbury R, Wilcox E, Lauenstein J, Gigliuto R, LaBel K, O'Bryan M. COMPENDIUM OF RECENT TOTAL IONIZING DOSE AND DISPLACEMENT DAMAGE FOR CANDIDATE SPACECRAFT ELECTRONICS FOR NASA. In: Radiation Effects Data Workshop (REDW), 2013 IEEE. Radiation Effects Data Workshop (REDW), 2013 IEEE; 2013; 2013. p. 1-9.
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  9. Ladbury R, Berg M, Wilcox E, LaBel K, Kim H, Phan A, Seidleck C. USE OF COMMERCIAL FPGA-BASED EVALUATION BOARDS FOR SINGLE-EVENT TESTING OF DDR2 AND DDR3 SDRAMS. Nuclear Science, IEEE Transactions on. 2013;PP (99):
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  10. Ferlet-Cavrois V, Binois C, Carvalho A, Ikeda N, Inoue M, Eisener B, Gamerith S, Chaumont G, Pintacuda F, Javanainen A, Schwank J, Shaneyfelt M, Lauenstein J, Ladbury R, Muschitiello M, Poivey C, Mohammadzadeh A. STATISTICAL ANALYSIS OF HEAVY-ION INDUCED GATE RUPTURE IN POWER MOSFETS-METHODOLOGY FOR RADIATION HARDNESS ASSURANCE. IEEE Trans. Nucl. Sci. 2012;59 (6):2920-2929.
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  11. Ladbury R. 2011 IEEE NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE AWARDS COMMENTS BY THE CHAIRMAN. Nuclear Science, IEEE Transactions on. 2011;58 (6):2548-2549.
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  12. Ladbury R, Triggs B. BAYESIAN APPROACH FOR TOTAL IONIZING DOSE HARDNESS ASSURANCE. Nuclear Science, IEEE Transactions on. 2011;PP (99):1-7.
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  13. Lauenstein J, Goldsman N, Liu S, Titus J, Ladbury R, Kim H, Phan A, LaBel K, Zafrani M, Sherman P. EFFECTS OF ION ATOMIC NUMBER ON SINGLE-EVENT GATE RUPTURE (SEGR) SUSCEPTIBILITY OF POWER MOSFETS. IEEE Trans. Nucl. Sci. 2011;58 (6):2628-2636.
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  14. Berg M, Kim H, Friendlich M, Perez C, Seidleck C, LaBel K, Ladbury R. SEU ANALYSIS OF COMPLEX CIRCUITS IMPLEMENTED IN ACTEL RTAX-S FPGA DEVICES. Nuclear Science, IEEE Transactions on. 2011;PP (99):
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  15. Pellish J, Xapsos M, Stauffer C, Jordan T, Sanders A, Ladbury R, Oldham T, Marshall P, Heidel D, Rodbell K. IMPACT OF SPACECRAFT SHIELDING ON DIRECT IONIZATION SOFT ERROR RATES FOR SUB-130 NM TECHNOLOGIES. IEEE Trans. Nucl. Sci. 2010;57 (6):3183-3189.
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  16. Lauenstein J, Ladbury R, Goldsman N, Kim H, Batchelor D, Phan A. INTERPRETING SPACE-MISSION LET REQUIREMENTS FOR SEGR IN POWER MOSFETS. IEEE Transactions on Nuclear Science. 2010;57 (6):3443-3449.
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  17. Marshall C, Marshall P, Ladbury R, Waczynski A, Arora R, Foltz R, Cressler J, Kahle D, Chen D, Delo G, Dodds N, Pellish J, Kan E, Boehm N, Reed R, LaBel K. MECHANISMS AND TEMPERATURE DEPENDENCE OF SINGLE EVENT LATCHUP OBSERVED IN A CMOS READOUT INTEGRATED CIRCUIT FROM 16-300 K. IEEE Trans. Nucl. Sci. 2010;57 (6):3078-3086.
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  18. Ladbury R. STATISTICAL TECHNIQUES FOR ANALYZING PROCESS OR "SIMILARITY" DATA IN TID HARDNESS ASSURANCE. IEEE Transactions on Nuclear Science. 2010;57 (6):3432-3437.
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  19. O'Bryan M, LaBel K, Pellish J, Buchner S, Ladbury R, Oldham T, Kim H, Campola M, Lauenstein J, Chen D, Berg M, Sanders A, Marshall P, Marshall C, Xapsos M, Kruckmeyer K, Leftwich M, Leftwich M, Benedetto J. SINGLE EVENT EFFECTS COMPENDIUM OF CANDIDATE SPACECRAFT ELECTRONICS FOR NASA. In: 2009 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD. IEEE Radiation Effects Data Workshop; JUL 20-24, 2009; Quebec, CANADA. 2009. p. 15-24.
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  20. Ladbury R, Gorelick J, McClure S. STATISTICAL MODEL SELECTION FOR TID HARDNESS ASSURANCE. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 46th Annual IEEE International Nuclear and Space Radiation Effects Conference; JUL 20-24, 2009; Quebec City, CANADA. 2009. p. 3354-3360.
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